Cu2O XRD analysis identifies and characterizes cuprous oxide via X-ray diffraction. This technique confirms the cubic cuprite structure of Cu2O. Primary diffraction peaks appear at specific 2θ angles using Cu Kα radiation. The strongest peak occurs near 36.4°, corresponding to the (111) crystal plane. Other significant peaks include (200) near 42.3°, (110) near 29.6°, (211) near 61.3°, and (220) near 73.5°. These peak positions serve as fingerprints for Cu2O identification. XRD precisely measures the lattice parameter, typically around 4.27 Å for pure Cu2O. Peak broadening analysis assesses crystallite size and strain. XRD effectively distinguishes Cu2O from other copper oxides like monoclinic CuO (tenorite). Key CuO peaks appear near 35.5° and 38.7°. The presence or absence of these peaks confirms phase purity. XRD is crucial for verifying successful Cu2O synthesis. It detects potential impurities like Cu or CuO. Changes in peak intensity or position can indicate doping or strain effects. Comparing experimental patterns to reference databases like ICDD PDF 05-0667 confirms the Cu2O phase. Sample preparation is vital; fine, random powder packing ensures accurate peak intensities. XRD provides non-destructive phase analysis essential for Cu2O applications in solar cells, catalysis, and sensors. Monitoring phase stability under different conditions is another key use. Understanding the Cu2O XRD pattern is fundamental for material characterization.
(cu2o xrd)
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